Detection Technology, a provider of X-ray detector solutions, has announced that it is broadening its linear detector array (LDA) offering that is based on time delay integration (TDI) technology to enhance in-line battery inspection.

The company says it has launched X-Scan T02 cameras, which come with unique high-resolution, high-speed complementary metal oxide semiconductor (CMOS) sensor design and upgraded front and back-end electronics to maximize the benefits of industrial inspection to its fullest.

Advantages

”The X-Scan T02 series combines the advantages of X-ray flat panel detectors (FPD) and line scanners. It features superior image quality as FPDs and fast scanning speeds associated with LDAs. Very high resolution and high speed make it an ideal solution for in-line industrial inspection that values the most accurate detection of the smallest quality issues, fast product throughputs, and maximized production line up-times,” said Tomi Fält, Director, Product Management at Detection Technology.

According to the company, X-Scan T02 is a perfect match for the inspection of different types of battery cells and battery modules at different stages of manufacturing processes. It is designed and optimized for battery inspection of electric vehicles to cover all types of battery cells such as cylindrical, prismatic and pouch cells with Li-Ion and other commonly used battery chemistries. TDI-boosted line-scan modality enables the rapid and accurate inspection of placement and alignment of laminated electrode layers and other critical features without imaging distortion or projection errors.

Furthermore, Detection Technology highlights that the X-Scan T02 series is fitted for quality inspection of applications where very high spatial resolution is critical. Examples of such applications are high-value automotive, aerospace and electronic components, parts and assemblies and food and pharmaceutical goods.

High sensitivity

Detection Technology says that the X-Scan T02 features a CMOS sensor with a 50 µm pixel size to enable high sensitivity and spatial resolution with low X-ray doses. Typically, spatial resolution that is dependent on magnification measures a few micrometers. Furthermore, X-Scan T02 enables fast scanning speeds of up to 20–30 kHz line rates. Depending on the cell size, this means 1–1.5 m/s object movement or 1,000–2,500 parts-per-minute speed with TDI-processed native image data resolution.

The X-ray series is equipped with smart features and configuration options, which enable object movement to be further sped up, or to multiply parts-per-minute inspection rates in the process. Such features and options include digital TDI operating modality, bidirectional scanning operation, defect pixel mapping and correction functionality, region of interest configuration, programmable ROI mode and flexible pixel binning options.

“We are particularly proud that the X-Scan T02 comes with the 10 Gigabit Ethernet interface and is compatible with the GigE Vision Protocol. This enables robust, reliable and fast communication between the detector and X-ray systems and supports third-party software platforms without the need to have a specific image grabber hardware on the system computer,” added Fält.